Structural, magnetic and electronic properties of Zn0.94Co0.06O/ZnO heterostructure
dc.contributor.author | Rajput, Parasmani | |
dc.contributor.author | Nand, Mangla | |
dc.contributor.author | Gupta, Mukul | |
dc.contributor.author | Sagdeo, P.R. | |
dc.contributor.author | Sagdeo, A. | |
dc.contributor.author | Sharma, S.K. | |
dc.contributor.author | Coelha, A.A. | |
dc.contributor.author | Jha, S.N. | |
dc.contributor.author | Bhattacharyya, D. | |
dc.contributor.author | Kumar, Manvendra | |
dc.date.accessioned | 2024-01-21T10:42:34Z | |
dc.date.accessioned | 2024-08-13T12:44:37Z | |
dc.date.available | 2024-01-21T10:42:34Z | |
dc.date.available | 2024-08-13T12:44:37Z | |
dc.date.issued | 2021-10-12T00:00:00 | |
dc.description.abstract | In the present work, single layers of ZnO, Zn0.94Co0.06O and Zn0.94Co0.06O/ZnO heterostructure thin film on quartz substrates as well as on Si (111) substrate have been prepared using RF ion beam sputtering. Grazing incident X-ray diffraction (GIXRD), UV�Vis spectroscopy, X-ray absorption near edge structure (XANES), vibrating sample magnetometer�(VSM) and photoelectron spectroscopy (PES) were performed to obtain structural, optical, electronic properties. GIXRD measurement confirms Wurtzite structure of ZnO, whereas UV�Vis spectroscopy shows a blue shift of the absorption edge in Zn0.94Co0.06O single layer with respect to ZnO film with band gap of 3.18 and 3.32�eV for ZnO and Zn0.94Co0.06O single layer films, respectively. The O K-edge spectra revealed O 2p hybridization with Zn3d4s/Co3d states, whereas Co L3-edge and Co K-edge XANES spectra confirm Co2+ oxidation state. M-H hysteresis measurement at 300�K shows a weak ferromagnetism for Zn0.94Co0.06O single layer and Zn0.94Co0.06O/ZnO heterostructure thin film. Furthermore, to obtain band offset of Zn0.94Co0.06O/ZnO heterostructure thin films, valance band maximum and core level peaks were measured using PES measurement. The offsets in valance band and conduction band for Zn0.94Co0.06O/ZnO heterostructure thin film were obtained as ~0.41�eV and ~0.55�eV, respectively, and compared with ~0.36�eV and ~0.51�eV, respectively, of Zn0.9Co0.1O/ZnO heterostructure thin films. The results show that a type-II band alignment in the studied system. � 2021, The Author(s), under exclusive licence to Springer-Verlag GmbH, DE part of Springer Nature. | en_US |
dc.identifier.doi | 10.1007/s00339-021-04969-w | |
dc.identifier.issn | 9478396 | |
dc.identifier.uri | http://10.2.3.109/handle/32116/3677 | |
dc.identifier.url | https://link.springer.com/10.1007/s00339-021-04969-w | |
dc.language.iso | en_US | en_US |
dc.publisher | Springer Science and Business Media Deutschland GmbH | en_US |
dc.subject | Heterostructure interface | en_US |
dc.subject | VB | en_US |
dc.subject | XANES | en_US |
dc.subject | XPS | en_US |
dc.subject | XRD | en_US |
dc.title | Structural, magnetic and electronic properties of Zn0.94Co0.06O/ZnO heterostructure | en_US |
dc.title.journal | Applied Physics A: Materials Science and Processing | en_US |
dc.type | Article | en_US |
dc.type.accesstype | Closed Access | en_US |