Comparative performance of fault-prone prediction classes with k-means clustering and MLP

dc.contributor.authorSingh, Satwinder
dc.contributor.authorSingla, Rozy
dc.date.accessioned2018-07-14T01:18:39Z
dc.date.accessioned2024-08-14T05:05:40Z
dc.date.available2018-07-14T01:18:39Z
dc.date.available2024-08-14T05:05:40Z
dc.date.issued2016
dc.description.abstractSoftware defect in today's era is most important in the field of software engineering. Most of the organizations used various techniques to predict defects in their products before they are delivered. Defect prediction techniques help the organizations to use their resources effectively which results in lower cost and time requirements. There are various techniques that are used for predicting defects in software before it has to be delivered. For example clustering, neural networks, support vector machine (SVM) etc. In this paper two defect prediction techniques:-K-means Clustering and Multilayer Perceptron model (MLP), are compared. Both the techniques are implemented on different platforms. K-means clustering is implemented using WEKA tool and MLP is implemented using SPSS. The results are compared to find which algorithm produces better results. In this paper Object-Oriented metrics are used for predicting defects in the software. ? 2016 ACM.en_US
dc.identifier.citationSingh, S., & Singla, R. (2016). Comparative performance of fault-prone prediction classes with k-means clustering and MLP. Paper presented at the ACM International Conference Proceeding Series.en_US
dc.identifier.doi10.1145/2905055.2905123
dc.identifier.isbn9.78E+12
dc.identifier.urihttps://kr.cup.edu.in/handle/32116/1279
dc.identifier.urlhttps://dl.acm.org/citation.cfm?doid=2905055.2905123
dc.language.isoen_USen_US
dc.publisherAssociation for Computing Machineryen_US
dc.subjectDefectsen_US
dc.subjectForecastingen_US
dc.subjectMultilayer neural networksen_US
dc.subjectNeural networksen_US
dc.subjectSoftware engineeringen_US
dc.subjectSupport vector machinesen_US
dc.subjectComparative performanceen_US
dc.subjectDefect predictionen_US
dc.subjectFault-proneen_US
dc.subjectK-means clusteringen_US
dc.subjectObject oriented metricsen_US
dc.subjectSoftware defectsen_US
dc.subjectTime requirementsen_US
dc.subjectWekaen_US
dc.subjectObject oriented programmingen_US
dc.titleComparative performance of fault-prone prediction classes with k-means clustering and MLPen_US
dc.title.journalACM International Conference Proceeding Seriesen_US
dc.typeConference Paperen_US

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