Paschen curve approach to investigate electron density and deposition rate of Cu in magnetron sputtering system

dc.contributor.authorGopikishan, S.
dc.contributor.authorBanerjee, I.
dc.contributor.authorBogle, K.A.
dc.contributor.authorDas, A.K.
dc.contributor.authorPathak, A.P.
dc.contributor.authorMahapatra, S.K.
dc.date.accessioned2018-07-14T01:19:02Z
dc.date.accessioned2024-08-13T12:45:52Z
dc.date.available2018-07-14T01:19:02Z
dc.date.available2024-08-13T12:45:52Z
dc.date.issued2016
dc.description.abstractIn this work, Paschen curve for argon gas was obtained during copper deposition using a DC magnetron sputtering system. Five process parameters of Paschen curve were used to obtain the electron density and deposition rate of the deposited nanostructured thin films. Plasma parameter such as electron density was correlated with the deposition rate. It is observed that a minimum deposition rate was obtained for the plasma process parameter corresponding to the Paschen minimum. This investigation helps to understand and optimize the quality of nanostructured thin films depending on the process parameters. ? 2016 Informa UK Limited, trading as Taylor & Francis Group.en_US
dc.identifier.citationGopikishan, S., Banerjee, I., Bogle, K. A., Das, A. K., Pathak, A. P., & Mahapatra, S. K. (2016). Paschen curve approach to investigate electron density and deposition rate of Cu in magnetron sputtering system. Radiation Effects and Defects in Solids, 171(11-12), 999-1005. doi: 10.1080/10420150.2016.1267734en_US
dc.identifier.doi10.1080/10420150.2016.1267734
dc.identifier.issn10420150
dc.identifier.urihttps://kr.cup.edu.in/handle/32116/1423
dc.identifier.urlhttps://www.tandfonline.com/doi/full/10.1080/10420150.2016.1267734
dc.language.isoenen_US
dc.publisherTaylor and Francis Inc.en_US
dc.subjectArgonen_US
dc.subjectCarrier concentrationen_US
dc.subjectDeposition ratesen_US
dc.subjectElectron density measurementen_US
dc.subjectElectronsen_US
dc.subjectMagnetron sputteringen_US
dc.subjectThin filmsen_US
dc.subjectCopper depositionen_US
dc.subjectDC magnetron sputtering systemsen_US
dc.subjectMagnetron sputtering systemsen_US
dc.subjectNanostructured thin filmen_US
dc.subjectPaschen curvesen_US
dc.subjectPaschen minimumsen_US
dc.subjectPlasma parameteren_US
dc.subjectProcess parametersen_US
dc.subjectDepositionen_US
dc.titlePaschen curve approach to investigate electron density and deposition rate of Cu in magnetron sputtering systemen_US
dc.title.journalRadiation Effects and Defects in Solids
dc.typeArticleen_US

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