Computer Science And Technology - Research Publications

Permanent URI for this collectionhttps://kr.cup.edu.in/handle/32116/82

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    A Comprehensive Review on Performance of AODV Protocol for Wormhole Attack
    (IJRET, 2014) Kaur, Gurmeet; Kaur, Amanpreet
    Wireless Networking is becoming very popular and interesting technology especially in these days as everyone wants wireless connectivity at anywhere anytime. It contains numerous wireless network technologies such as WiFi, WiMax, HSDPA and WiBro etc. Based on structural arrangement, wireless networks are categorized into two main categories: fixed infrastructure wireless networks and infrastructure less wireless networks. Mobile Ad-Hoc Networks (MANETs) come under the category of infrastructure less wireless networks, which is an autonomous system of mobile hosts connected by wireless links. Nodes are free to move and can join or leave the network at any time whenever required. Wireless ad hoc networks eradicate various problems which may come out while setting up the infrastructure. Communication among nodes in these networks is accomplished via different routing protocols. But these protocols have different security flaws and using these flaws, an attacker can launch many kinds of attacks. Wormhole attack is one of the serious attack in the context of mobile ad-hoc network, which can disrupt any routing channel completely. In this work, an attempt has been made to compare the performance of on-demand reactive routing protocol: Ad hoc On Demand Distance Vector (AODV) with two approaches: normal and attack. The performance metrics evaluated for the two examined approaches are Throughput, Packet Delivery Ratio, Delay and Jitter.
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    Detection of defective printed circuit boards using image processing
    (Inderscience Publishers, 2018) Kaur, Beant; Kaur, Gurmeet; Kaur, Amandeep
    Manufacturing of printed circuit boards involves three stages (printing, component fabrication over surface of printed circuit boards, soldering of components), where inspection at every stage is very important to improve the quality of production. Image subtraction method is widely used for finding the difference between any two images. Using this method, defects have been detected by finding the difference between reference (defect free) and test image (to be inspected). The major limitation of image subtraction is that both the images should have same size and same orientation. The proposed method removes the above explained limitation of image subtraction method and also calculates total number of defects on printed circuit boards. The proposed method is tested on six test images. The experimental results show that proposed method is simple, economical and easy to implement in small and medium scale industries where most of the inspection is still done by humans.